@misc{indiciae12146bc4e538,
  title = {A new method for measuring excess carrier lifetime in bulk silicon: Photoexcited muon spin spectroscopy},
  author = {K. Yokoyama and J. S. Lord and J. Miao and P. Murahari and A. J. Drew},
  year = {2017},
  doi = {10.1103/physrevlett.119.226601},
  url = {https://arxiv.org/abs/1702.06846},
  note = {Source identifier: 1702.06846}
}