TY  - RPRT
TI  - A new method for measuring excess carrier lifetime in bulk silicon: Photoexcited muon spin spectroscopy
AU  - K. Yokoyama
AU  - J. S. Lord
AU  - J. Miao
AU  - P. Murahari
AU  - A. J. Drew
PY  - 2017
DO  - 10.1103/physrevlett.119.226601
UR  - https://arxiv.org/abs/1702.06846
ID  - 1702.06846
ER  -