TY  - RPRT
TI  - Passivation and characterization of charge defects in ambipolar silicon quantum dots
AU  - P. C. Spruijtenburg
AU  - S. V. Amitonov
AU  - F. Mueller
AU  - W. G. van der Wiel
AU  - F. A. Zwanenburg
PY  - 2017
DO  - 10.1038/srep38127
UR  - https://arxiv.org/abs/1702.06857
ID  - 1702.06857
ER  -