@misc{indiciae8b320a863314,
  title = {Extent of Variation Resilience in Strained CMOS: From Transistors to Digital Circuits},
  author = {Ahmad Ehteshamul Islam and Charles Augustine and Kaushik Roy and Muhammad Ashraful Alam},
  year = {2017},
  url = {https://arxiv.org/abs/1702.06992},
  note = {Source identifier: 1702.06992}
}