TY  - RPRT
TI  - Extent of Variation Resilience in Strained CMOS: From Transistors to Digital Circuits
AU  - Ahmad Ehteshamul Islam
AU  - Charles Augustine
AU  - Kaushik Roy
AU  - Muhammad Ashraful Alam
PY  - 2017
UR  - https://arxiv.org/abs/1702.06992
ID  - 1702.06992
ER  -