@misc{indiciaed3762ef32171,
  title = {Ultra high precision refractive index measurement of Si at \$γ\$-ray energies up to 2 MeV},
  author = {M. M. Günther and M. Jentschel and A. J. Pollitt and P. G. Thirolf and M. Zepf},
  year = {2017},
  doi = {10.1103/physreva.95.053864},
  url = {https://arxiv.org/abs/1702.07023},
  note = {Source identifier: 1702.07023}
}