TY  - RPRT
TI  - Ultra high precision refractive index measurement of Si at $γ$-ray energies up to 2 MeV
AU  - M. M. Günther
AU  - M. Jentschel
AU  - A. J. Pollitt
AU  - P. G. Thirolf
AU  - M. Zepf
PY  - 2017
DO  - 10.1103/physreva.95.053864
UR  - https://arxiv.org/abs/1702.07023
ID  - 1702.07023
ER  -