TY  - RPRT
TI  - Optimizing surface defects for atomic-scale electronics: Si dangling bonds
AU  - Peter Scherpelz
AU  - Giulia Galli
PY  - 2017
DO  - 10.1103/physrevmaterials.1.021602
UR  - https://arxiv.org/abs/1702.07747
ID  - 1702.07747
ER  -