TY  - RPRT
TI  - Phonon linewidth due to electron-phonon interactions with strong forward scattering in FeSe thin films on oxide substrates
AU  - Yan Wang
AU  - Louk Rademaker
AU  - Elbio Dagotto
AU  - Steven Johnston
PY  - 2017
DO  - 10.1103/physrevb.96.054515
UR  - https://arxiv.org/abs/1703.02013
ID  - 1703.02013
ER  -