TY  - RPRT
TI  - Long-run dynamics of the U.S. patent classification system
AU  - Francois Lafond
AU  - Daniel Kim
PY  - 2018
DO  - 10.1007/s00191-018-0603-3
UR  - https://arxiv.org/abs/1703.02104
ID  - 1703.02104
ER  -