TY  - RPRT
TI  - Nanoparticle Classification in Wide-field Interferometric Microscopy by Supervised Learning from Model
AU  - Oguzhan Avci
AU  - Celalettin Yurdakul
AU  - M. Selim Unlu
PY  - 2017
DO  - 10.1364/ao.56.004238
UR  - https://arxiv.org/abs/1703.02997
ID  - 1703.02997
ER  -