@misc{indiciae0943b86ba280,
  title = {Oxygen migration during resistance switching and failure of hafnium oxide memristors},
  author = {Suhas Kumar and Ziwen Wang and Xiaopeng Huang and Niru Kumari and Noraica Davila and John Paul Strachan and David Vine and A. L. David Kilcoyne and Yoshio Nishi and R. Stanley Williams},
  year = {2017},
  doi = {10.1063/1.4974535},
  url = {https://arxiv.org/abs/1703.03106},
  note = {Source identifier: 1703.03106}
}