TY  - RPRT
TI  - Oxygen migration during resistance switching and failure of hafnium oxide memristors
AU  - Suhas Kumar
AU  - Ziwen Wang
AU  - Xiaopeng Huang
AU  - Niru Kumari
AU  - Noraica Davila
AU  - John Paul Strachan
AU  - David Vine
AU  - A. L. David Kilcoyne
AU  - Yoshio Nishi
AU  - R. Stanley Williams
PY  - 2017
DO  - 10.1063/1.4974535
UR  - https://arxiv.org/abs/1703.03106
ID  - 1703.03106
ER  -