TY  - RPRT
TI  - High precision half-life measurement of $^{147}$Sm $α$ decay from thin-film sources
AU  - Heinrich Wilsenach
AU  - Kai Zuber
AU  - Detlev Degering
AU  - René Heller
AU  - Volker Neu
PY  - 2017
DO  - 10.1103/physrevc.95.034618
UR  - https://arxiv.org/abs/1703.07282
ID  - 1703.07282
ER  -