TY  - RPRT
TI  - Ultrafast Hot Carrier Dynamics in GaN and its Impact on the Efficiency Droop
AU  - Vatsal A. Jhalani
AU  - Jin-Jian Zhou
AU  - Marco Bernardi
PY  - 2017
DO  - 10.1021/acs.nanolett.7b02212
UR  - https://arxiv.org/abs/1703.07880
ID  - 1703.07880
ER  -