TY  - RPRT
TI  - Fundamental characteristic length scale for the field dependence of hopping charge transport in disordered organic semiconductors
AU  - A. V. Nenashev
AU  - J. O. Oelerich
AU  - A. V. Dvurechenskii
AU  - F. Gebhard
AU  - S. D. Baranovskii
PY  - 2017
DO  - 10.1103/physrevb.96.035204
UR  - https://arxiv.org/abs/1704.00167
ID  - 1704.00167
ER  -