TY  - RPRT
TI  - Analysis and validation of low-frequency noise reduction in MOSFET circuits using variable duty cycle switched biasing
AU  - Kapil Jainwal
AU  - Mukul Sarkar
AU  - Kushal Shah
PY  - 2017
UR  - https://arxiv.org/abs/1704.00876
ID  - 1704.00876
ER  -