TY  - RPRT
TI  - The effect of the three-dimensional strain variation on the emission properties of light-emitting diodes based on (In,Ga)N/GaN nanowires
AU  - M. Musolino
AU  - F. Sacconi
AU  - A. Tahraoui
AU  - F. Panetta
AU  - C. De Santi
AU  - M. Meneghini
AU  - E. Zanoni
AU  - L. Geelhaar
PY  - 2017
UR  - https://arxiv.org/abs/1704.01569
ID  - 1704.01569
ER  -