TY  - RPRT
TI  - High Throughput Characterization of Epitaxially Grown Single-Layer MoS2
AU  - Foad Ghasemi
AU  - Riccardo Frisenda
AU  - Dumitru Dumcenco
AU  - Andras Kis
AU  - David Perez de Lara
AU  - Andres Castellanos-Gomez
PY  - 2017
DO  - 10.3390/electronics6020028
UR  - https://arxiv.org/abs/1704.01900
ID  - 1704.01900
ER  -