TY  - RPRT
TI  - Self-protected nanoscale thermometry based on spin defects in silicon carbide
AU  - Yu Zhou
AU  - Junfeng Wang
AU  - Xiaoming Zhang
AU  - Ke Li
AU  - Jianming Cai
AU  - Wei-bo Gao
PY  - 2017
DO  - 10.1103/physrevapplied.8.044015
UR  - https://arxiv.org/abs/1704.03301
ID  - 1704.03301
ER  -