TY  - RPRT
TI  - High temperature resistivity measured at ν = 5/2 as a predictor of 2DEG quality in the N=1 Landau level
AU  - Qi Qian
AU  - James R. Nakamura
AU  - Saeed Fallahi
AU  - Geoffrey C. Gardner
AU  - John D. Watson
AU  - Michael J. Manfra
PY  - 2017
DO  - 10.1103/physrevb.95.241304
UR  - https://arxiv.org/abs/1704.03794
ID  - 1704.03794
ER  -