TY  - RPRT
TI  - Extended depth-range profilometry using the phase-difference and phase-sum of two close-sensitivity projected fringes
AU  - Manuel Servin
AU  - Moises Padilla
AU  - Guillermo Garnica
PY  - 2017
DO  - 10.1016/j.optlaseng.2018.02.012
UR  - https://arxiv.org/abs/1704.04662
ID  - 1704.04662
ER  -