TY  - RPRT
TI  - ZnO and ZnO$_{1-x}$ based thin film memristors: The effects of oxygen deficiency and thickness in resistive switching behavior
AU  - Fatih Gul
AU  - Hasan Efeoglu
PY  - 2017
DO  - 10.1016/j.ceramint.2017.05.090
UR  - https://arxiv.org/abs/1704.06574
ID  - 1704.06574
ER  -