TY  - RPRT
TI  - A novel intrinsic interface state controlled by atomic stacking sequence at interfaces of SiC/SiO$_2$
AU  - Yu-ichiro Matsushita
AU  - Atsushi Oshiyama
PY  - 2017
DO  - 10.1021/acs.nanolett.7b03490
UR  - https://arxiv.org/abs/1704.07094
ID  - 1704.07094
ER  -