@misc{indiciae4831918c063b,
  title = {Physics-Based Modeling of TID Induced Global Static Leakage in Different CMOS Circuits},
  author = {Gennady I. Zebrev and Vasily V. Orlov and Maxim S. Gorbunov and Maxim G. Drosdetsky},
  year = {2017},
  url = {https://arxiv.org/abs/1704.07265},
  note = {Source identifier: 1704.07265}
}