TY  - RPRT
TI  - Physics-Based Modeling of TID Induced Global Static Leakage in Different CMOS Circuits
AU  - Gennady I. Zebrev
AU  - Vasily V. Orlov
AU  - Maxim S. Gorbunov
AU  - Maxim G. Drosdetsky
PY  - 2017
UR  - https://arxiv.org/abs/1704.07265
ID  - 1704.07265
ER  -