TY  - RPRT
TI  - Sampling Biased Monotonic Surfaces using Exponential Metrics
AU  - Sam Greenberg
AU  - Dana Randall
AU  - Amanda Pascoe Streib
PY  - 2017
DO  - 10.1017/s0963548320000188
UR  - https://arxiv.org/abs/1704.07322
ID  - 1704.07322
ER  -