@misc{indiciaea63b10813432,
  title = {Robust Estimators and Test-Statistics for One-Shot Device Testing Under the Exponential Distribution},
  author = {N. Balakrishnan and E. Castilla and N. Martin and L. Pardo},
  year = {2017},
  url = {https://arxiv.org/abs/1704.07865},
  note = {Source identifier: 1704.07865}
}