TY  - RPRT
TI  - Robust Estimators and Test-Statistics for One-Shot Device Testing Under the Exponential Distribution
AU  - N. Balakrishnan
AU  - E. Castilla
AU  - N. Martin
AU  - L. Pardo
PY  - 2017
UR  - https://arxiv.org/abs/1704.07865
ID  - 1704.07865
ER  -