TY  - RPRT
TI  - Characterization of Thin Film Materials using SCAN meta-GGA, an Accurate Nonempirical Density Functional
AU  - I. G. Buda
AU  - C. Lane
AU  - B. Barbiellini
AU  - A. Ruzsinszky
AU  - J. Sun
AU  - A. Bansil
PY  - 2017
DO  - 10.1038/srep44766
UR  - https://arxiv.org/abs/1704.07922
ID  - 1704.07922
ER  -