TY  - RPRT
TI  - Dependent Microstructure Noise and Integrated Volatility Estimation from High-Frequency Data
AU  - Z. Merrick Li
AU  - Roger J. A. Laeven
AU  - Michel H. Vellekoop
PY  - 2018
UR  - https://arxiv.org/abs/1704.08964
ID  - 1704.08964
ER  -