TY  - RPRT
TI  - Carbon Ejection from a SiO2/SiC(0001) Interface by Annealing in High-Purity Ar
AU  - Takuma Kobayashi
AU  - Tsunenobu Kimoto
PY  - 2017
DO  - 10.1063/1.4997599
UR  - https://arxiv.org/abs/1705.00814
ID  - 1705.00814
ER  -