TY  - RPRT
TI  - A versatile scanning photocurrent mapping system to characterize optoelectronic devices based on 2D materials
AU  - Christoph Reuter
AU  - Riccardo Frisenda
AU  - Der-Yuh Lin
AU  - Tsung-Shine Ko
AU  - David Perez de Lara
AU  - Andres Castellanos-Gomez
PY  - 2017
UR  - https://arxiv.org/abs/1705.01785
ID  - 1705.01785
ER  -