TY  - RPRT
TI  - Bi-directional top hat D-Scan: single beam accurate characterization of nonlinear waveguides
AU  - Samuel Serna
AU  - Nicolas Dubreuil
PY  - 2017
DO  - 10.1364/ol.42.003072
UR  - https://arxiv.org/abs/1705.04452
ID  - 1705.04452
ER  -