TY  - RPRT
TI  - Sampling-based Buffer Insertion for Post-Silicon Yield Improvement under Process Variability
AU  - Grace Li Zhang
AU  - Bing Li
AU  - Ulf Schlichtmann
PY  - 2017
DO  - 10.3850/9783981537079_0250
UR  - https://arxiv.org/abs/1705.04990
ID  - 1705.04990
ER  -