TY  - RPRT
TI  - EffiTest: Efficient Delay Test and Statistical Prediction for Configuring Post-silicon Tunable Buffers
AU  - Grace Li Zhang
AU  - Bing Li
AU  - Ulf Schlichtmann
PY  - 2017
DO  - 10.1145/2897937.2898017
UR  - https://arxiv.org/abs/1705.04992
ID  - 1705.04992
ER  -