@misc{indiciaef5193d20b5e0,
  title = {Impact of Junction Depth and Abruptness on the Activation and the Leakage Current in Germanium n\$\textasciicircum{}\{+\}\$/p Junctions},
  author = {William Hsu and Amritesh Rai and Xiaoru Wang and Yun Wang and Taegon Kim and Sanjay K. Banerjee},
  year = {2017},
  url = {https://arxiv.org/abs/1705.06733},
  note = {Source identifier: 1705.06733}
}