TY  - RPRT
TI  - Impact of Junction Depth and Abruptness on the Activation and the Leakage Current in Germanium n$^{+}$/p Junctions
AU  - William Hsu
AU  - Amritesh Rai
AU  - Xiaoru Wang
AU  - Yun Wang
AU  - Taegon Kim
AU  - Sanjay K. Banerjee
PY  - 2017
UR  - https://arxiv.org/abs/1705.06733
ID  - 1705.06733
ER  -