@misc{indiciae3507d0d8afde,
  title = {Atomic-scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control},
  author = {Wei-Hsiang Lin and Victor W. Brar and Deep Jariwala and Michelle C. Sherrott and Wei-Shiuan Tseng and Chih-I Wu and Nai-Chang Yeh and Harry A. Atwater},
  year = {2017},
  url = {https://arxiv.org/abs/1705.07970},
  note = {Source identifier: 1705.07970}
}