TY  - RPRT
TI  - Atomic-scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control
AU  - Wei-Hsiang Lin
AU  - Victor W. Brar
AU  - Deep Jariwala
AU  - Michelle C. Sherrott
AU  - Wei-Shiuan Tseng
AU  - Chih-I Wu
AU  - Nai-Chang Yeh
AU  - Harry A. Atwater
PY  - 2017
UR  - https://arxiv.org/abs/1705.07970
ID  - 1705.07970
ER  -