TY  - RPRT
TI  - Analysis of Carrier Accumulation in Active Region by Energy Loss Mechanisms in InGaN Light-Emitting Diodes
AU  - Dong-Pyo Han
AU  - Jong-In Shim
AU  - Dong-Soo Shin
PY  - 2017
UR  - https://arxiv.org/abs/1705.08251
ID  - 1705.08251
ER  -