TY  - RPRT
TI  - Analysis of single and composite structural defects in pure amorphous silicon: a first-principles study
AU  - Yoritaka Furukawa
AU  - Yu-ichiro Matsushita
PY  - 2017
DO  - 10.1016/j.jnoncrysol.2017.07.031
UR  - https://arxiv.org/abs/1705.09266
ID  - 1705.09266
ER  -