@misc{indiciae1ea17d0323a4,
  title = {Morphological characterization of Ge ion implanted SiO2 matrix using multifractal technique},
  author = {R. P. Yadav and V. Baranwal and Sunil Kumar and Avinash C Pandey and A. K. Mittal},
  year = {2017},
  url = {https://arxiv.org/abs/1705.10456},
  note = {Source identifier: 1705.10456}
}