TY  - RPRT
TI  - Morphological characterization of Ge ion implanted SiO2 matrix using multifractal technique
AU  - R. P. Yadav
AU  - V. Baranwal
AU  - Sunil Kumar
AU  - Avinash C Pandey
AU  - A. K. Mittal
PY  - 2017
UR  - https://arxiv.org/abs/1705.10456
ID  - 1705.10456
ER  -