TY  - RPRT
TI  - Sparse Iterative Learning Control with Application to a Wafer Stage: Achieving Performance, Resource Efficiency, and Task Flexibility
AU  - Tom Oomen
AU  - Cristian R. Rojas
PY  - 2017
DO  - 10.1016/j.mechatronics.2017.09.004
UR  - https://arxiv.org/abs/1706.01647
ID  - 1706.01647
ER  -