TY  - RPRT
TI  - STM/S study of electronic inhomogeneity evolution with gate voltage in graphene: role of screening and charge-state of interface defects
AU  - Anil Kumar Singh
AU  - Anjan Kumar Gupta
PY  - 2017
DO  - 10.1103/physrevb.97.195415
UR  - https://arxiv.org/abs/1706.08703
ID  - 1706.08703
ER  -