TY  - RPRT
TI  - Empirical transport model of strained CNT transistors used for sensor applications
AU  - C. Wagner
AU  - J. Schuster
AU  - T. Gessner
PY  - 2017
DO  - 10.1007/s10825-016-0823-4
UR  - https://arxiv.org/abs/1706.09611
ID  - 1706.09611
ER  -