@misc{indiciae9e142f26abbc,
  title = {Estimating the rate of defects under imperfect sampling inspection - a new approach},
  author = {Tamar Gadrich and Guy Katriel},
  year = {2019},
  url = {https://arxiv.org/abs/1707.00114},
  note = {Source identifier: 1707.00114}
}