TY  - RPRT
TI  - Stochastic Dynamics of Resistive Switching: Fluctuations Lead to Optimal Particle Number
AU  - Paul K. Radtke
AU  - Andrew L. Hazel
AU  - Arthur V. Straube
AU  - Lutz Schimansky-Geier
PY  - 2017
DO  - 10.1088/1367-2630/aa818b
UR  - https://arxiv.org/abs/1707.06648
ID  - 1707.06648
ER  -