TY  - RPRT
TI  - Mathematical Estimation of Logical Masking Capability of Majority/Minority Gates Used in Nanoelectronic Circuits
AU  - P Balasubramanian
AU  - R T Naayagi
PY  - 2017
UR  - https://arxiv.org/abs/1707.06913
ID  - 1707.06913
ER  -